Benchtop EDXRF Analyzer | Rigaku NEX QC+
Methods: ISO 13032, ASTM D4294, ASTM D6481, ASTM D5059, ASTM D8252, JIS K 2541, IP 336, IP 496, ISO 8754, ISO 20847
EDXRF analyzer specifically designed for routine quality control applications
Minimized X-ray tube wear and tear by operating only during data collection
Peltier-cooled High-resolution Si Drift Detector(SDD) delivers exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution.
High Precision and Broad Elemental Coverage
To contact Radiant Instruments Pty Ltd about Benchtop EDXRF Analyzer | Rigaku NEX QC+ use Get a quote.
Methods: ISO 13032, ASTM D4294, ASTM D6481, ASTM D5059, ASTM D8252, JIS K 2541, IP 336, IP 496, ISO 8754, ISO 20847
EDXRF analyzer specifically designed for routine quality control applications
Minimized X-ray tube wear and tear by operating only during data collection
Peltier-cooled High-resolution Si Drift Detector(SDD) delivers exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution.
High Precision and Broad Elemental Coverage
To contact Radiant Instruments Pty Ltd about Benchtop EDXRF Analyzer | Rigaku NEX QC+ use Get a quote.
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